Principles of Scanning Electron Microscopy

The SEM uses a beam of electrons to scan the surface of a sample to build a three-dimensional image of the specimen.  The next few pages will demonstrate this principle.

 

SEM Web Site created and maintained by David J. Wright and Shirley J. Wright
Department of Biology, The University of Dayton.
All images and text are copyright protected.  All rights reserved.
Copyright © 1999 Shirley J. Wright (Shirley.Wright@notes.udayton.edu)